JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope

The highly-acclaimed optical system of the JSM-7610F has been updated, achieving even better resolution (15 kV 0.8 nm, 1 kV 1.0nm), and is now available as the JSM-7610FPlus.The Semi-in lens type objective lens and High Power Optics of the irradiation system deliver high-spatial resolution observation and stable analysis capability.In addition, the JSM-7610FPlus can be equipped to satisfy a variety of user needs, including observation at low accelerating voltages with GENTLEBEAMâ„¢ mode, and signal selection using r-filter.