The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. The accelerated Ga (gallium) ion beam is focused onto a specimen to enable SIM image observation of the specimen surface, milling, and deposition of materials like carbon or tungsten. The system also enables preparation of a thin-film specimen for TEM imaging and a cross-section specimen for observing the interior of the specimen. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.
